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ELEC 284 - Characterization, Testing of Nanotechnology Structures and Materials

Institution:
Butler County Community College
Subject:
Electronics
Description:
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), fluorescence microscopes, and fourier transform infrared spectroscopy.
Credits:
3.00
Credit Hours:
Prerequisites:
ELEC 274, ELEC 282
Corequisites:
ELEC 283
Exclusions:
Level:
Instructional Type:
Lecture
Notes:
Additional Information:
Historical Version(s):
Institution Website:
Phone Number:
(724) 287-8711
Regional Accreditation:
Middle States Association of Colleges and Schools
Calendar System:
Semester

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