SCI 220 - PRAC SCAN ELECTRON MICROSCOPY

Institution:

Kutztown University of Pennsylvania

Subject:

Science Education

Description:

A practical introduction to the basic concepts underlying electron beam analysis of materials, emphasizing signals generated by scanning electron microscopes, including secondary electron, backscatter electron, scanning transmitted electron, and cathodoluminescence imaging, as well as energy dispersive x-ray spectroscopy. Topics include sample preparation, basic SEM operation, strategies for ameliorating complications in data collection, and brief introduction to emerging analytical methods such as electron backscatter diffractometry, electron energy-loss spectroscopy, and focused ion beam microscopy.

Credits:

3.00

Credit Hours:

Prerequisites:

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture/Lab

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.kutztown.edu/

Phone Number:

(610) 683-4000

Regional Accreditation:

Middle States Association of Colleges and Schools

Calendar System:

Semester

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